Tektronix Analyzers & SMU's
Device Types and Series
Spectrum Analyzers & RF Signal Analyzers
Industry leading RF signal analysis from USB handheld to high-end bench performance
Keithley 4200A-SCS Parameter Analyzer
A fully integrated solution to characterize materials, processes and semiconductor devices
| DC Current-Voltage (I-V) Range | Capacitance-Voltage (C-V) Range | Pulsed I-V Range |
| 10 aA – 1A | 1 kHz – 10 MHz | ±40 V (80 V p-p), ±800 mA |
| 0.2 µV – 210 V | ± 30V DC bias | 200 MSa/sec, 5 ns sampling rate |
Optical Modulation Analyzers
Characterize modulation with a library of results and plots
- Get the full insight of your signal quality
Advanced visual signal analysis using constellation, spectral plots and eye diagrams, plus an extensive list of numerical parameters including EVM, BER, bias errors and more. - Up to 70GHz of system bandwidth
Characterize 400G-ZR, 800G-ZR and signals up to 140GBaud with 70GHz of OMA system bandwidth. - Maximize your return on investment
With the modular architecture of Tektronix DPO70000SX oscilloscopes, you can decouple some of the oscilloscopes and test optical or electrical PAM4 or PAM8 signals. - Accurate measurements with the lowest EVM noise floor
Industry’s lowest EVM noise floor makes it the ideal OMA for characterizing higher order modulation formats such as 64QAM.
Frequency Counters/Timers
Feature-rich tools for precision measurements
| Model | Max Frequency | Time Resolution | Frequency Resolution | Channels |
| MCA3000 Microwave Analyzer | 27 GHz – 40 GHz | 100 ps | 12 digit | 3 |
| FCA3000/3100 | 300 MHz – 20 GHz | 50 ps – 100 ps | 12 digit | 02-Mar |
Source Measure Units
Keithley 2400 Graphical Touchscreen Series SMU
- Nanostructured Materials Research
- Power Semiconductor GaN, SiC
- Biosensor Development
- Semiconductor Device Design
- Automotive Sensor Design
Max Power Envelope | V & I range | Best Accuracy | Max Speed |
100 W DC | 10n V to 1100 V, | 0.00012 | 1 MS/s sampling |
1000 W Pulse | 10 fA to 10 A | 6.5 digits | 100 kS/s to buffer |
SMU 2600B: Single or Dual Channel Systems
- Semiconductor Production Test
- Semiconductor Device Design
- Transistor Characterization
- IDDQ Testing and Standby Current Testing
- Multi-Pin Device Test
Channels | Min V/I Pulse Source | V/I range | Max Speed |
2 or 1 | <100 µs, 0.1% settled | 0.1 fA to 10 A, 100 nV to 200 V | 20k readings/s to buffer |
2601B-PULSE System SourceMeter® 10 μs Pulser/SMU Instrument
- VCSEL Test for LIDAR
- High Brightness LED Test
- Laser Diode Production Test
- Semiconductor Device Design
Channels | Pulser V/I Range | SMU V/I Range | Accuracy | Max Speed |
1 Pulser / 1 SMU | 1 μA – 10 A | 100 fA – 10 A | Pulser: 0.05% | 1 M readings/s |
Keithley 2400 Standard Series SMU
- Resistor/Resistor Network Production Test
- Connector, Relay, Switch Test
- Accelerated Stress Testing
- Circuit Protection Device Test
- Materials Research
Max Power Envelope | V & I range | Accuracy | Max Speed |
60 W DC | 100 nV to 1100 V, 1 pA to 5 A | 0.012%, 6.5 digits | 2000 rdgs/s to buffer |
SMU 2650 Series for High Power
- Power Semiconductor GaN, SiC
- Solar Panel Test
- Electromigration studies
- Semiconductor junction temperature characterization
SMU 2606B: High Density SMU
- VCSEL, Laser Diode Production Test
- LED Production Test
- Transistor Characterization
CHANNELS | V/I RANGE | ACCURACY | MAX SPEED |
4 | 100fA – 3A, 100nV – 20V | 0.015%, 6.5 digits | 20k readings/s to buffer |
