PCB Immunity, PCB Emission, IC Test, IC Security & Positioning Systems
With the IC (integrated circuit) test system the developer tests the behavior of circuits during specific disturbances (conducted and radiated) or their emissions. The IC is tested in operation.
Langer EMV-Technik is in the forefront of research, development, and production in the field of EMC. Through EMC experimental seminars and EMC workshops. Langer EMV-Technik offers comprehensive knowledge to their customers.
Langer EMV-Technik interference emission and interference immunity EMC measurement technology as well as the IC test system are used mainly in the development stage and are in worldwide demand.
Developers and designers gain new perspectives and more efficient working strategies for module- and IC developments with the EMC know how and measurement technology of Langer EMV-Technik GmbH.
The individual pre-compliance consulting services provided by Langer EMV-Technik GmbH help developers and designers quickly find solutions to complex EMC problems in IC, device, and module development.
Langer EMV-Technik make both our comprehensive EMC expertise and research results available to their customers via practical experimental EMC seminars and in-house events .
IC Test Environment
The IC test system is designed for the measuremet of EMC behavior of circuits (ICs) at specific radiated or conducted disturbance influences and for transmission measurements. The test IC is tested in operation. The ICE1 test environment generates the functional environment of the test ICs. The respective measuring task is done with the appropriate probe set. These sets are not included in the scope of delilvery.
The test IC is installed on the test PC board. The costumer can prepare the test PC board (IC test instructions of Langer EMV-Technik GmbH) or the costumer can place an order at Langer EMV-Technik GmbH. The PC board is inserted into the GND 25 ground plate and via a connector connected to CB 0708 connecting board. Other ICE1 set components are: different ground adapter for testing different PC boards, connection board control software, an oscilloscope adapter for transforming measured signals in order to visualize them at the oscilloscope. Additional equipment for setting up IC test stations are included in the scope of delivery as well.
RF Conducted Measurement IEC 61967-4, 1 Ohm / 150 Ohm
The probe set is used to measure conducted emissions (measurements with direct 1 Ohm/150 Ohm-coupling) according to IEC 61967-4 at IC pins. For the current and voltage measurement there is one respective probe available. Every Test-IC pin can be reached and contacted by the probe.
RF Conducted Measurement Analysis, 1 Ohm / 150 Ohm
The probe set is used to measure conducted emissions (measurements with direct 1 Ohm/150 Ohm-coupling) at IC pins. For the current and voltage measurement there is one respective probe available. Every Test-IC pin can be reached and contacted by the probe.
1 Ohm / 150 Ohm, Conducted RF Measurement acc. IEC 61967-4
The probe set is used to measure conducted emissions
1 Ohm/150 Ohm with the direct coupling method on IC pins. The S603 probe is used for current measurement and the S750 probe is used for voltage measurement.
RF Field Emission up to 1 GHz
The RF field emission probe set consists of a magnetic field probe and an E field probe. They are used to measure respective near fields, which are coupled out by an IC in operation/ a running IC. The measured data help to assess the seperate emission of an IC according to the types of field.
RF Field Emission up to 3 GHz
The RF field emission probe set consists of a magnetic field probe and an electric field probe. They are used to measure the respective radiated near fields of an IC in operation. The measured data help to assess separately the emissions of an IC according to field types.
These probes allow for conducted and radiated EFT coupling into an IC.
Pulse Injection Langer Pulses 1.5/5 ns and 1.5/20 ns
The P202 and P302 pulse generators are used to determine an IC’s pulse immunity. During a Burst/ESD device test the generated pulse-shaped disturbances reach any ICs in the device under test. To individually test ICs, the pulse generators from LANGER EMV-Technik GmbH simulate these reduced disturban…
EFT/Burst Injection up to 6 kV
The P250 probe is used for direct-contact measurements of impulse immunity in IC pins, according to IEC 62215-3 and IEC 61000-4-4. Knowledge of impulse immunity parameters through use of the P250 probe makes optimization of the IC and definition of application requirements possible. The probe P250 h…
EFT/Burst Field Coupling
The field sources, which are included in the probe set EFT/Burst field coupling, generate electric and magnetic EFT/Burst pulse fields. With these fields, ICs are defined and reproducibly pulsed to determine their immunity against EFT/Burst pulse fields. The reason for this is the EFT/Burst immunity…
EFT/Burst Magnetic Field Source
The BS 06DB-s magnetic field source is used to generate magnetic EFT/burst fields. An EFT/burst generator (IEC 61000-4-4) supplies the field source with an EFT/burst current via an RF cable. The field source generates high magnetic fields (approx. 200 mT) in very small spaces (2.54 mm²). It is thus …
EFT/Burst Magnetic Field Source
The BS 06DU-s magnetic field source is used to generate magnetic EFT/burst fields. An EFT/burst generator (IEC 61000-4-4) supplies the field source with an EFT/burst current via an RF cable. The field source generates high magnetic fields (approx. 150 mT) in very small spaces. It is thus ideal for c…
These probes allow for conducted and radiated ESD coupling into an IC.
ESD Pulse Injection acc. IEC 61000-4-2
The P331-2 probe set is used for conducted coupling of ESD pulses into ICs. The P331-2 probe sizing orientates itself by mechanisms of the ESD coupling into electronic assemblies (according to IEC 61000-4-2 / HMM). The BPS 203 burst power station supplys and controls the probe.
Langer ESD Pulse 0.2/5 Injection
The P331 L-ESD probe set is used for conducted coupling of Langer ESD pulses (200 ps rise time) into ICs. The P331 L-ESD probe sizing orientates itself by mechanisms of the ESD coupling into electronic assemblies. BPS 203 powers and controls the probe.
ESD Magnetic Field Coupling
The field source, which are included in the probe set ESD/magnetic field coupling, generates magnetic ESD fields. With this field, ICs are defined and reproducibly pulsed to determine their immunity against ESD fields. The reason for this is the ESD immunity of PC boards and electrical devices. The…
ESD Langer Pulse H 0.2/2.5 E 0.2/5.5 ns Field Coupling
The field sources, which are included in the probe set field coupling 200 ps Langer ESD, generate very fast electric and magnetic ESD pulse fields. With these fields, ICs are defined and reproducibly pulsed to determine their immunity against ESD fields. The reason for this is the ESD immunity of PC…
These probes allow for conducted and radiated HF coupling into an IC.
RF Power Injection and Measurement IEC 62132-4 up to 12 GHz
The RF probe 12 GHz P512 is used for power injection (DPI) into IC pins according to IEC 62132-4. Due to the special design of the probe tip, the probe can be used as a coupling network for DPI as well as an RF probe and thus DPI investigations and RF measurements up to 12 GHz can be performed.
RF Power Injection IEC 62132-4 up to 3 GHz
The P501/P503 probe set is used for conducted measurements of immunity according to IEC 62132-4. The gained knowledge of immunity parameters allows the IC optimization as well as the definition of the application requirements. Available DPI couple networks (P501, P503) allow the RF coupling with dif…
RF Power Injection IEC 62132-4 up to 1 GHz
The P503 probe set is used for conducted measurements of immunity according to IEC 62132-4. The gained knowledge of immunity parameters allows the IC optimization as well as the definition of the application requirements.
RF Field Coupling up to 1 GHz
The RF field coupling up to 1 GHz probe set tests the ICs in terms of their immunity under the influence of RF magnetic fields (P1401) or RF E-fields (P1501). These analyzes are the basis for an EMC compatible development of ICs. Furthermore, the determined RF parameters are helpful for the IC user…
| Probe P201 Conducted pulse injection low impedance |  |
| Probe P301 Conducted pulse injection high impedance |  |
| Probe P1202-2 ESD magnetic field injection Pulse shape: according to standard IEC 61000-4-2 |  |
| Probe P1202-4 EFT magnetic field injection Pulse shape: according to standard IEC 61000-4-4 |  |
| Probe P1302-4 EFT E-field injection Pulse shape: according to standard IEC 61000-4-4 |  |
| Probe P1401 RF magnetic field injection up to 1 GHz |  |
| Probe P1402 RF magnetic field injection up to 3 GHz |  |
| Probe P1501 RF E-field injection up to 1 GHz |  |
| Probe P1502 RF E-field injection up to 3 GHz |  |
| Probe P1601 RF measurement of magnetic field emission up to 1 GHz |  |
| Probe P1602 RF measurement of magnetic field emission up to 3 GHz |  |
| Probe P1702 RF measurement of magnetic field emission up to 3 GHz |  |
| EFT Generator Adjustable pulse sequence |  |
| TEM CELL Parameterised for TEM CELL: FCC-TEM-JM3 |  |
| Stripline Parameterised for stripline: µSL80A |  |
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KodichikkanaHalli, Begur Hobli,
Bangalore, Karnataka – 560076, INDIA