PCB Immunity, PCB Emission, IC Test, IC Security & Positioning Systems
With the products for IC security, ICs can be analyzed in detail using electromagnetic side-channel analysis (SCA) and their function can be specifically faulted with electromagnetic disturbance pulses (EMFI).
Langer EMV-Technik is in the forefront of research, development, and production in the field of EMC. Through EMC experimental seminars and EMC workshops. Langer EMV-Technik offers comprehensive knowledge to their customers.
Langer EMV-Technik interference emission and interference immunity EMC measurement technology as well as the IC test system are used mainly in the development stage and are in worldwide demand.
Developers and designers gain new perspectives and more efficient working strategies for module- and IC developments with the EMC know how and measurement technology of Langer EMV-Technik GmbH.
The individual pre-compliance consulting services provided by Langer EMV-Technik GmbH help developers and designers quickly find solutions to complex EMC problems in IC, device, and module development.
Langer EMV-Technik make both our comprehensive EMC expertise and research results available to their customers via practical experimental EMC seminars and in-house events .
Double Pulse Magnetic Field Source set
| Probe head dimensions: | Ø 150 µm |
| Pulse parameter | |
| Rise time | 2 ns |
| Min. double pulse sequence time | 25 ns (200 V) |
| Polarity (set by software) | +/- |
| Voltage | 50 – 1000 V |
| max. Jitter (typ.) | ± 1 ns |
| Min. trigger pulse delay | 35 ns |
Double Pulse Magnetic Field Source set
The set ICI-DP HH250-15 set is designed to inject electromagnetic pulses with high temporal and spatial resolution into safety critical circuits (electromagnetic fault injection – EMFI). This set can be used to generate single pulses as well as a double pulse sequence with a pulse following time of …
| Probe head dimensions: | Ø 250 µm |
| Pulse parameter | |
| Rise time | 2 ns |
| Min. double pulse sequence time | 25 ns (200 V) |
| Polarity (set by software) | +/- |
| Voltage | 50 – 1000 V |
| max. Jitter (typ.) | ± 1 ns |
| Min. trigger pulse delay | 35 ns |
Double Pulse Magnetic Field Source set
The set ICI-DP HH500-15 set is designed to inject electromagnetic pulses with high temporal and spatial resolution into safety critical circuits (electromagnetic fault injection – EMFI). This set can be used to generate single pulses as well as a double pulse sequence with a pulse following time of …
| Probe head dimensions: | Ø 500 µm |
| Pulse parameter | |
| Rise time | 2 ns |
| Min. double pulse sequence time | 25 ns (200 V) |
| Polarity (set by software) | +/- |
| Voltage | 50 – 1000 V |
| max. Jitter (typ.) | ± 1 ns |
| Min. trigger pulse delay | 35 ns |
Double Pulse Magnetic Field Source set
The ICI-DP set is designed to inject electromagnetic pulses with high temporal and spatial resolution into safety critical circuits (electromagnetic fault injection – EMFI). This set can be used to generate single pulses as well as a double pulse sequence with a pulse following time of minimum 25 ns…
| Probe head dimensions: | Ø 500 µm |
| Pulse parameter | |
| Rise time | 2 ns |
| Min. double pulse sequence time | 25 ns (200 V) |
| Polarity (set by software) | +/- |
| Voltage | 50 – 1000 V |
| max. Jitter (typ.) | ± 1 ns |
| Min. trigger pulse delay | 35 ns |
Double Pulse Magnetic Field Source set
The set ICI-DP HH1000-15 set is designed to inject electromagnetic pulses with high temporal and spatial resolution into safety critical circuits (electromagnetic fault injection – EMFI). This set can be used to generate single pulses as well as a double pulse sequence with a pulse following time of…
| Probe head dimensions: | Ø 1000 µm |
| Pulse parameter | |
| Rise time | 2 ns |
| Min. double pulse sequence time | 25 ns (200 V) |
| Polarity (set by software) | +/- |
| Voltage | 50 – 1000 V |
| max. Jitter (typ.) | ± 1 ns |
| Min. trigger pulse delay | 35 ns |
Pulse Magnetic Field Source set
| Pulse parameter | |
| Rise time | < 2 ns |
| Repetition frequency | 0.1 Hz – 20 kHz |
| Polarity (set by software) | + / – / alternating |
| Trigger-pulse delay (Bypass Mode – Delay Line) | |
| min. Trigger-pulse delay (typ.) | 100 ns (probe-specific) |
| max. Trigger-pulse delay (typ.) | 450 ns |
| max. Jitter (typ.) | ± 1 ns |
| Supply voltage | BPS 202 |
| Software | BPS 202-Client / DLL (32 Bit / 64 Bit) Win XP SP3 or higher |
Pulse Current Probe set
| Pulse parameter | |
| Rise time | < 2 ns |
| Repetition frequency | 0.1 Hz – 20 kHz |
| Polarity (set by software) | + / – / alternating |
| Trigger-pulse delay (Bypass Mode – Delay Line) | |
| min. Trigger-pulse delay (typ.) | 100 ns |
| max. Trigger-pulse delay (typ.) | 450 ns |
| max. Jitter (typ.) | ± 1 ns |
| Supply voltage | BPS 202 |
| Software | BPS 202-Client / DLL (32 Bit / 64 Bit) Win XP SP3 or higher |
Pulse E-Field Source set
| Pulse parameter | |
| Rise time | < 2 ns |
| Repetition frequency | 0.1 Hz – 20 kHz |
| Polarity (set by software) | + / – / alternating |
| Trigger-pulse delay (Bypass Mode – Delay Line) | |
| min. Trigger-pulse delay (typ.) | 100 ns (probe-specific) |
| max. Trigger-pulse delay (typ.) | 450 ns |
| max. Jitter (typ.) | ± 1 ns |
| Supply voltage | BPS 202 |
| Software | BPS 202-Client / DLL (32 Bit / 64 Bit) Win XP SP3 or higher |
IC EM Pulse Injection Langer Pulse
| Pulse parameter | |
| Rise time | < 2 ns |
| Repetition frequency | 0.1 Hz – 20 kHz |
| Polarity (set by software) | + / – / alternating |
| Trigger-pulse delay (Bypass Mode – Delay Line) | |
| min. Trigger-pulse delay (typ.) | 100 ns |
| max. Trigger-pulse delay (typ.) | 450 ns |
| max. Jitter (typ.) | ± 1 ns |
| Trigger-pulse delay (Timer Mode) | |
| min. Trigger-pulse delay (typ.) | 200 ns |
| max. Trigger-pulse delay (typ.) | 100 ms |
| max. Jitter (typ.) | ± 15 ns |
| Trigger delay, min. increment | 10 ns |
| Supply voltage | BPS 202 |
| Software | BPS 202-Client / DLL (32 Bit / 64 Bit) Win XP SP3 or higher |
The ICR HH set contains one ICR near-field microprobe for magnetic field measurement. The measuring coil is horizontal in the probe head. The ICR probes are operated with a positioning system (Langer Scanner).
The ICR HV set contains one ICR near-field microprobe for magnetic field measurement. The measuring coil is vertical in the probe head. The ICR probes are operated with a positioning system (Langer Scanner).
The ICR 03 set contains three of our ICR near-field microprobes (magnetic or E field) of your choice. The probes are used to measure magnetic or electric near fields with extremely high resolution and sensitivity. Optimal is a distance of < 1 mm to the measuring object. The probe head is equipped wi…
The near-field microprobe is designed for a high-resolution measurement of electrical near fields. With the ICR E probe the following measurements can be performed: – Surface Scan via IC according to IEC 61967-3 – Volumenscan via IC – Pin Scan The measuring electrode at the ICR RF probe head is hori…
The RF3 mini set consists of two passive near-field probes with a resolution under 1 millimeter for measuring magnetic fields between 30 MHz and 3 GHz on electronic assemblies during the development stage. The probes have special miniature heads which are designed for detailed measurements of magnet…
IC Scanner 4-Axis Positioning System
The ICS 105 IC scanner allows for measurements of high-frequency near fields above ICs. Depending on the used ICR near-field microprobe magnetic or electric fields can be measured with a measuring resolution of 50 to 100 µm. The probe can also be automatically rotated to determine the magnetic field’s direction.
Optionally the ICS 105 scanner can be used for measurements above small assemblies in combination with UH-DUT universal holder and SH 01 probe holder.
The IC scanner can be set up for ESD or EFT immunity tests on ICs in a few simple steps.
| Supply voltage | 110 / 230 V |
| Interface | USB |
| Max. traverse range | (50 x 50 x 50) mm; α-Rotation ±180° |
| Min. step size | (10 x 10 x 10) µm; α-Rotation 1° |
| Positioning speed | (10 x 10 x 5) mm/s; α-Rotation 90°/s |
| Weight | 23 kg |
| Sizes (L x W x H) | (350 x 400 x 420) mm |
| 3D scan |  |
| Surface scan |  |
IC Scanner 4-Axis Positioning System
The FLS 106 IC scanner is a 4-axes positioning system that allows for the movement of ICR near-field probes along three linear axes and the rotation of the ICR near-field probes on one axis above an IC in its electronic assembly.
The ICR near-field probes allow for the measurement of high-frequency magnetic or E-fields up to 6 GHz with a high measuring resolution of 50 to 100 µm.
The IC scanner can be set up for surface scans and ESD or EFT immunity tests in a few simple steps.
| Supply voltage | 110 V / 230 V |
| Interface | USB |
| Axes x, y, z; α | |
| Max. traverse range | (400 x 600 x 120) mm; α-Rotation ±180° |
| Min. step size | (20 x 20 x 20) µm; α-Rotation 1° |
| Positioning speed | (20 x 25 x 10) mm/s; α-Rotation 90°/s |
| Weight | 75 kg |
| Sizes (L x W x H) | (1030 x 775 x 900) mm |
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KodichikkanaHalli, Begur Hobli,
Bangalore, Karnataka – 560076, INDIA