Langer EMV-Technik

PCB Immunity, PCB Emission, IC Test, IC Security & Positioning Systems

PCB Immunity

About Langer EMV-Technik

Langer EMV-Technik is in the forefront of research, development, and production in the field of EMC. Through EMC experimental seminars and EMC workshops. Langer EMV-Technik offers comprehensive knowledge to their customers.

Langer EMV-Technik interference emission and interference immunity EMC measurement technology as well as the IC test system are used mainly in the development stage and are in worldwide demand.

Developers and designers gain new perspectives and more efficient working strategies for module- and IC developments with the EMC know how and measurement technology of Langer EMV-Technik GmbH.

The individual pre-compliance consulting services provided by Langer EMV-Technik GmbH help developers and designers quickly find solutions to complex EMC problems in IC, device, and module development.

Langer EMV-Technik make both our comprehensive EMC expertise and research results available to their customers via practical experimental EMC seminars and in-house events .

PCB Immunity

Immunity Development System

E1 set

Immunity Development System

The E1 is a set of EMC tools used for EMI suppression in printed circuit boards during the development phase. The developer can use the E1 set to quickly identify the causes of burst and ESD interference. This allows the developer to design suitable measures to solve the causes of the interference. It can also be used to test the effectiveness of the measures taken. The E1 test set-up is small and fits easily on a developer’s desk. The E1 set user manual describes EMC mechanisms and provides detailed descriptions of basic measuring strategies for interference suppression in printed circuit boards. The E1 set includes a generator to generate burst and ESD disturbances.

S2 set

Magnetic Field Probes for E1

The S2 set contains active and passive magnetic field probes. They measure the nonreactive fast transient pulse magnetic fields in electronic devices and assemblies under interference. Burst and ESD processes, which cause problems in the device under test, can be analyzed. The magnetic field probes transmit the measured signals via the LWL connection to the optical receiver of the SGZ 21. The S2 set can only be operated with the SGZ 21 burst generator included in the E1 set.

One AAA battery is required to operate the MSA 02 probe.

Mini Burst Field Generators

P1 set

Mini Burst Field Generators
Scope of delivery
Technical parameters
Generated E-field strengthca. 100 kV/m
Generated magnetic flux densityca. 1 mT
Pulse parameter 
Frequencysingle / 5 kHz
Supply voltage1.5 V / AAA

P23 set

Mini Burst Field Generator (E)
Scope of delivery
Technical parameters
Generator voltage1.2 kV
Coupling capacity10 pF
Pulse parameter 
Rise time1.8 ns … 10 ns
Frequencysingle / 5 kHz
Supply voltage1.5 V / AAA

P11t set

Mini Burst Field Generator (B, Trigger)
Scope of delivery
Technical parameters
External trigger inputSMB, male, jack; 5 V TTL
Generated magnetic flux densityca. 1 mT
Pulse parameter 
Frequencysingle … 10 kHz
Trigger-pulse delay3 µs
Supply voltage6.5 V … 15 V

P12t set

Mini Burst Field Generator (B, Trigger)
Scope of delivery
Technical parameters
External trigger inputSMB, male, jack; 5 V TTL
Generated magnetic flux densityca. 1 mT
Pulse parameter 
Frequencysingle … 10 kHz
Trigger-pulse delay3 µs
Supply voltage6.5 V … 15 V

Accessory EFT/Burst generators IEC 61000-4-4

H4-IC set

EFT/Burst Magnetic
Scope of delivery
Technical parameters
BS 06DB-s EFT/Burst Magnetic Field Source 
Frequency range0…66 MHz
Resolution2.54 mm²
Generated magnetic flux density2.37 mT/A
Probe head dimensionsØ 1.8 mm
Max. generated magnetic flux density200 mT
Connector – outputSMB, female, jack
Max. Burst-voltage4 kV

H5-IC set

EFT/Burst Magnetic Field Source
Scope of delivery
Technical parameters
BS 06DU-s EFT/Burst Magnetic Field Source 
Probe head dimensions(5 x 6) mm
Frequency range0…560 MHz
Max. generated magnetic flux density150 mT
Waveform of the injected test pulseIEC 61000-4-4
Connector – outputSMB, female, jack
Sizes (L x W x H)(140 x 8 x 8) mm
Weight15 g
Max. Burst-voltage4 kV

Optical Signal Transmission

Analog

The optical fiber cable probes are used to transmit analog signals from the device under test under the influence of EFT/burst disturbance.

A100-1 set, Optical Fiber Probe 1-channel, 25 kHz
The A100-1 set is used for oscillating analog signals under EFT/ESD/RF interference. The set is particularly suitable for the measurement of analog signals when testing the immunity of electrical or electronical devices (equipment) against high-frequency electromagnetic fields (IEC 61000-4-3 to IEC …


A100-2 set, Optical Fiber Probe 2-Channel, 25 kHz
The A100-2 set is used for oscillographing analog signals under EFT/ESD/RF interference. The set is particularly suitable for the measurement of analog signals when testing the immunity of electrical or electronical devices (equipment) against high frequency electromagnetic fields (IEC 61000-4-3 to …


A200-1 set, Optical Fiber Probe 1-channel, 500 kHz
The A200-1 set consits of a sensor, which allows for oscilloscopically displaying analog signals under EFT/ESD/RF interference potential free. Disturbed signals can be easily detected. In the device under test the sensor transforms the measured analog signals into optical signals. The optical signal…


A200-2 set, Optical Fiber Probe 2-Channel, 500 kHz
The A200-2 set consists of two sensors which allow for potential free transmission of analog signals under EFT/ESD/RF interference. The signals are displayed on an oscilloscope. Disturbed signals can be easily detected. In the device under test the sensor transforms the measured logic signals into o…


A300-1 set, Optical Fiber Probe 1-channel, 5 MHz
The A300-1 set consists of a sensor, which allows for oscilloscopically displaying analog signals under EFT/ESD/RF interference potential free. Disturbed signals can be easily detected. In the device under test the sensor transforms the measured analog signals into optical signals. The optical signa…


A300-2 set, Optical Fiber Probe 2-Channel, 5 MHz
The A300-2 set consits of two sensors, which allow for displaying oscilloscopically analog signals under EFT/ESD/RF interference potential free. Disturbed signals can be easily detected. In the device under test the sensor transforms the measured logic signals into optical signals. The optical signa…

Digital

The fibre optic cable is used to transmit digital signals from the device under test under EFT/burst interference.

OSE 150-1 set, Optical Fiber Probe 1-channel, 50 Mbps
The OSE 150-1 set is used to transmit digital signals from a disturbed device under test (EFT/burst interference). The set consists of one sensor which detects logical signals and transforms them into optical signals. The light signals are transmitted to the optical receiver via a fiber optical cabl…

OSE 150-2 set, Optical Fiber Probe 2-Channel, 50 Mbps
With the OSE 150-2 set it is possible to potentially free oscilloscograph digital signals under EFT/burst interference. Disturbed signals from the device under test can be easily detected. The set consists of two single sensors which are used to detect two digital signals within the device under tes…

OSE 450 set, Optical Fiber Probe 4-Channel, 50 Mbps
The OSE 450 set is used to transmit digital signals from a disturbed device under test. It consists of four single sensors which are used to detect four digital signals inside the device under test and is connected to the oscilloscope via four fiber optical cables and one receiver. Within the device…

Bus Systems

The CAN and LIN bus systems allow for floating signal transmission according to the CAN/LIN standard.

OB 100 set, Opto-Box 100 LIN and CAN
The Opto-Box 100 converts electrical CAN or LIN signals into optical signals. By using two Opto-Box 100, it is easy to split up an existing cable connection and replace a section of the cable with a fiber optic connection.

CAN 100 set, Bus System
The CAN 100 set allows for the transmission of high speed CAN signals via optical fiber cables during EMC tests or when there are great potential differences (high voltage). The set consists of 2 small CAN probes.

LIN 100 set, Bus System
The LIN 100 set allows for a bidirectional, potential-free transmission of LIN signals via optical fiber cables during EMC tests or when there are great potential differences (high voltage). The set consists of 2 small LIN probes.

Burstdetector

BD 11

H-Field Burst Detector

The BD 11 is designed for the detection of a burst- or ESD current pulse within a cable. It facilitates the finding the causes of sporadic errors within the system. The burst detector is small and handy. It is highly sensitive and steplessly variable.

Technical parameters
Optical fibre connector2.2 mm Ø
Supply voltage2 x 1,5V AAA battery
Max. switching voltage125 V
Max. switching current1 A
Max. optical fibre length20 m
Sizes (L x W x H)(88 x 85 x 32) mm

Want help or have questions ?

Contact us
Scroll to Top